时刻表
时区：Asia/Shanghai
第1天2021年08月18日星期三
| TS1 |
Topic 1: Silicon Lifecycle Management for Emerging Memories@Tutorial2021年08月18日 09:00~12:00 ZOOM会议 进入会议室 时刻表 V4 发布时间：2021-08-18 08:34:22 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chair: Pingqiang Zhou | ||||
| 09:00 | 12:00 | 180 | 3 |
Silicon Lifecycle Management for Emerging MemoriesYervant Zorian/Synopsys
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| TS2 |
Tutorial 2, Scan Test Escapes, New Fault Models, and the Effectiveness of Functional System Level Tests@Tutorial2021年08月18日 19:00~22:00 ZOOM会议 进入会议室 时刻表 V4 发布时间：2021-08-18 08:34:22 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chair: Pingqiang Zhou | ||||
| 19:00 | 22:00 | 180 | 1 |
Scan Test Escapes, New Fault Models, and the Effectiveness of Functional System Level TestsAdit Singh/Auburn University
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第2天2021年08月19日星期四
| PS1 |
Openning and Keynote 1/2/3@Plenary Session(Openning, Keynotes 1-6)2021年08月19日 09:00~12:00 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-25 11:47:24 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| 09:00 | 09:30 | 30 | 74 |
OpeningYing Zhang/Tongji University
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| Session Chair: Zebo Peng | ||||
| 09:30 | 10:15 | 45 | 4 |
How to make chip intelligent – from an architecture perspectiveShaojun Wei Professor/Tsinghua University
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| 10:15 | 10:30 | 15 | Cofee Break | |
| Session Chair: Huawei Li | ||||
| 10:30 | 11:15 | 45 | 5 |
Life-Time Reliability for Memory Devices in AI ChipXinLi Gu Chief Architect Reli/Huawei Technology Co., Ltd.
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| 11:15 | 12:00 | 45 | 6 |
Towards Robust AI: A Test PerspectiveQiang Xu Associate Professor/The Chinese University of Hong Kong
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| RS1 |
A1. When Machine Learning Meets Testing and Security@Regular Paper Session2021年08月19日 20:00~20日 21:00 ZOOM会议 进入会议室 时刻表 V8 发布时间：2021-08-23 15:03:40 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Jiliang Zhang, He Li | ||||
| 20:00 | 20:20 | 20 | 51 |
Use Machine Learning Based Smart Sampling to Improve System Level Testing EfficiencyChenwei Liu/Huawei Technology Co., Ltd.
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| 20:20 | 20:40 | 20 | 62 |
The ANN Based Modeling Attack and Security Enhancement of the Double-layer PUFYongliang Chen/Peking University Shenzhen Graduate School
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| 20:40 | 21:00 | 20 | 48 |
Fault Modeling and Testing of Spiking Neural Network ChipsI-Wei Chiu/National Taiwan University；Li James Chien Mo/National Taiwan University
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| RS2 |
A2. Fault Monitoring, Detecting, and Modeling@Regular Paper Session2021年08月19日 21:05~22:05 ZOOM会议 进入会议室 时刻表 V8 发布时间：2021-08-23 15:03:40 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Zhezhi He, Xueyan Wang | ||||
| 21:05 | 21:25 | 20 | 60 |
Developing Formal Models for Measuring Fault Effects Using Functional EDA ToolsLingjuan Wu Associate Proferssor/,huazhong agricultural university
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| 21:25 | 21:45 | 20 | 63 |
Automatic Test Program Generation for Transition Delay Faults in Pipelined ProcessorsJiun-Lang Huang Professor/,National Taiwan University
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| 21:45 | 22:05 | 20 | 58 |
A Duty-Cycle Monitor Supporting A Wide Frequency Range of Clock SignalChen-Lin Tsai/NTHU
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| SS1 |
B1. Fault Tolerant TSV and Latch Designs@Special Session2021年08月19日 20:00~21:00 ZOOM会议 进入会议室 时刻表 V15 发布时间：2021-08-23 15:03:36 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Li Jiang, Zhengfeng Huang | ||||
| 20:00 | 20:20 | 20 | 29 |
A Low-Cost Quadruple-Node-Upset Self-Recoverable Latch DesignYan Wen Student/ChangSha university of science and technology
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| 20:20 | 20:40 | 20 | 50 |
Kelvin Bridge Structure Based TSV Test for Weak FaultsHao Chang/Anhui University of Finance & Economics
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| 20:40 | 21:00 | 20 | 47 |
A N:1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICsDanqing Li/HeFei University of Technology
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| SS2 |
A3. Learning based Discovery in ATPG, DfT, and Reverse Engineering@Special Session2021年08月19日 22:10~23:10 ZOOM会议 进入会议室 时刻表 V15 发布时间：2021-08-23 15:03:36 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Tanvir Arafin, Ying Zhang | ||||
| 22:10 | 22:30 | 20 | 45 |
Scalable Parallel Static LearningXiaoze Lin student/Shantou University
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| 22:30 | 22:50 | 20 | 33 |
An optimized DFT technology based on machine learningHan Yang/Nanjing University of Posts and Telecommunications
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| 22:50 | 23:10 | 20 | 66 |
Identification of Counter Registers through Full Scan ChainQidong Wang/Harbin Institute of Technology, Shenzhen
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| IS1 |
B2. The Advancement of 1149.10@Industrial Session2021年08月19日 21:05~20日 22:05 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-23 15:07:06 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Organizer: Yu Huang, Session Chair: Paul Reuter | ||||
| 21:05 | 21:25 | 20 | 71 |
Requirements of high-speed scan and DFT implementationFu Haitao DFT technical expert/HISILICON
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| 21:25 | 21:45 | 20 | 11 |
Solving test challenges in adopting serial scan for productionEd Seng/Teradyne Inc；Marc Hutner/Teradyne Inc
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| 21:45 | 22:05 | 20 | 12 |
Bringing 1149.10 to lifeJ-F Cote/Siemens Digital Industries Software；Geir Eide/Siemens Digital Industries Software
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| IS2 |
B3. Automotive Test and Reliability@Industrial Session2021年08月19日 22:10~20日 23:10 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-23 15:07:06 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Yu Huang, Ron Press | ||||
| 22:10 | 22:30 | 20 | 13 |
Challenges and case-studies in ensuring automotive quality on nanoscale SOCsDavid Francis/Texas Instruments, USA
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| 22:30 | 22:50 | 20 | 14 |
Advanced solutions to address automotive test & reliability challengesYervant Zorian/Synopsys
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| 22:50 | 23:10 | 20 | 15 |
Combining structural and functional monitoring for improving overall safety and reliability of automotive ICsNilanjan Mukherjee/Siemens Digital Industries Software
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第3天2021年08月20日星期五
| PS2 |
Keynote 4/5/6@Plenary Session(Openning, Keynotes 1-6)2021年08月20日 09:00~18:00 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-25 11:47:24 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Gang Qu | ||||
| 09:00 | 09:45 | 45 | 7 |
Ratio based Resistive RAM for Low Error Rate, High Energy Efficiency and In-Memory ComputingK-T. Tim Cheng Professor/Hong Kong University of Science and Technology
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| 09:45 | 10:30 | 45 | 8 |
Reliability of Carbon-Nanotube FET Circuits: Today’s Challenges and the Road AheadChakrabarty Krishnendu Professor/Duke University
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| 10:30 | 10:45 | 15 | Coffee break | |
| Session Chairs: Shi-Yu Huang | ||||
| 10:45 | 11:30 | 45 | 9 |
Emerging Need for Fast Thermal and Dynamic Voltage Drop Predictors for the Optimization of Scan/Functional Test PatternsNorman Chang Chief Technologist/ANSYS, Inc
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| RS3 |
A4 Circuit Design and Evaluation with Emerging Technology@Regular Paper Session2021年08月20日 11:30~12:30 ZOOM会议 进入会议室 时刻表 V8 发布时间：2021-08-23 15:03:40 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Qian Wang, Bing Li | ||||
| 11:30 | 11:50 | 20 | 61 |
Parallel DICE Cells and Dual-Level CEs based 3-Node-Upset Tolerant Latch Design for Highly Robust ComputingAibin Yan Associate professor/Anhui University
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| 11:50 | 12:10 | 20 | 55 |
High-speed measurement of Piezoelectric MEMS equivalent circuit parameters by Swept-sine and PRBS signalsMitsuo Matsumoto Expert Engineer/Advantest Corporation
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| 12:10 | 12:30 | 20 | 52 |
Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal ProbabilityZhen Wang Associate Professor/Shanghai University of Electric Power
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| SS3 |
A5. 3D test and 3D DFT@Special Session2021年08月20日 20:00~21:00 ZOOM会议 进入会议室 时刻表 V15 发布时间：2021-08-23 15:03:36 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Vivek Chickermane, Senling Wang | ||||
| 20:00 | 20:20 | 20 | 35 |
3D Test Wrapper Design and Physical OptimizationVivek Chickermane/Cadence Design Systems；Subhasish Mukherjee /Cadence
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| 20:20 | 20:40 | 20 | 36 |
Testing and Fault-Localization Solutions for Monolithic 3D ICsArjun Chaudhuri /Duke University
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| 20:40 | 21:00 | 20 | 37 |
Designing Parallel TAMs for 3D-SICs Based on IEEE Std 1838’s Flexible Parallel Port Leveraging Lessons-Learned on 2D-SOCsErik Jan Marinissen Scientific Director/imec
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| SS4 |
A6. Test Methods Towards Zero Failure Rate for Safety-Critical ICs@Special Session2021年08月20日 21:05~22:25 ZOOM会议 进入会议室 时刻表 V15 发布时间：2021-08-23 15:03:36 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Shi-Yu Huang, Dawen Xu | ||||
| 21:05 | 21:25 | 20 | 54 |
TAIWAN Online: Test AI with AN Codes Online for Automotive ChipsTsung-Chu Huang Professor/National Changhua University of Education
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| 21:25 | 21:45 | 20 | 69 |
Integrated Scratch Marker for Wafer Defect DiagnosisKatherine Shu-Min Li/National Sun Yat-Sen University
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| 21:45 | 22:05 | 20 | 65 |
Rigorous Test Flow for PLL to Identify Weak DevicesShi-Yu Huang/National Tsing Hua University
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| 22:05 | 22:25 | 20 | 72 |
AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop for Radiation HardeningCharles H.-P. Wen Professor/National Yang Ming Chiao Tung University
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| SS5 |
B6 Top Papers of ITC’2020@Special Session2021年08月20日 21:05~22:25 ZOOM会议 进入会议室 时刻表 V15 发布时间：2021-08-23 15:03:36 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Haihua Shen, Aibin Yan | ||||
| 21:05 | 21:25 | 20 | 49 |
Characterization, Modeling and Test of SyntheticAnti-FerromagnetFlip Defect in STT-MRAMsWu Lizhou Post Doc./,Delft University of Technology
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| 21:25 | 22:05 | 40 | 43 |
Industrial Application of IJTAG Standards to the Test of Big-A/little-d Devices – plus Updates to the Latest State of IEEE P1687.2Hans Martin von Staudt/DIALOG SEMICONDUCTOR
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| 22:05 | 22:25 | 20 | 44 |
Learning A Wafer Feature with One Training SampleYueling Jenny Zeng/University of California Santa Barbara
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| IS3 |
B4. Diagnosis and Yield Learning@Industrial Session2021年08月20日 11:30~12:30 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-23 15:07:06 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Yu Huang, Wu Yang | ||||
| 11:30 | 11:50 | 20 | 18 |
Diagnosis and Yield LearningRuifeng Guo /Synopsys, USA
|
| 11:50 | 12:10 | 20 | 16 |
Advancements in Diagnosis and YieldSameer Chillarige/Cadence
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| 12:10 | 12:30 | 20 | 17 |
Accuracy and scalability of physically aware diagnosis for yield learningWu-Tung Cheng /Siemens Digital Industries Software, USA
|
| IS4 |
B5. Industry Practice in SoC and Memory Test@Industrial Session2021年08月20日 20:00~21:00 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-23 15:07:06 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Fan Zhang, Jian Wang | ||||
| 20:00 | 20:20 | 20 | 59 |
An SRAM Test Quality Improvement Method For Automotive chipsTuanhui Xu/employees
|
| 20:20 | 20:40 | 20 | 56 |
A Dynamic Memory Maintenance Model Based on Physical ArchitectureShixin Xu/Duke Kunshan Universit
|
| 20:40 | 21:00 | 20 | 70 |
SoC Testability and Its Application in Life Cycle ManagementYang Liu FAE/HISILICON
|
| CS |
Closing Remark and Best Paper Reward@Closing Remark and Best Paper Reward2021年08月20日 22:30~22:45 ZOOM会议 进入会议室 会议主席：Ying Zhang/Tongji University 时刻表 V3 发布时间：2021-08-20 20:22:58 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Ying Zhang | ||||
| Closing Remarks and Best Paper Award | ||||
| 22:30 | 22:45 | 15 | 73 |
ITC-Asia 2021 Closing Remark & Best Paper AwardYing Zhang/Tongji University；Huawei Li/University of Chinese Academy of Sciences；Peng Zebo/Linkoping University；Rob Knoth/Cadence；Chang Soon-Jjh/National Cheng Kung University
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重要日期
-
会议日期
08月18日
2021
至08月20日
2021
-
05月10日 2021
初稿截稿日期
-
08月16日 2021
提前注册日期
-
08月19日 2021
报告提交截止日期
-
08月20日 2021
注册截止日期
主办单位
Tongji University
Chinese Computer Federation
承办单位
联系方式
- Prof. Zhang Ying
- yi******@tongji.edu.cn
历届会议
-
2022年08月24日 台湾-中国 Taipei
2022 IEEE International Test Conference in Asia -
2019年09月03日 日本 Tokyo
2019 IEEE International Test Conference in Asia -
2018年08月15日 中国
2018 IEEE International Test Conference in Asia -
2017年09月13日 台湾-中国 Taipei
2017 IEEE International Test Conference in Asia -
2014年11月10日 中国 杭州市
IEEE International Test Conference in Asia
