Reliability of Carbon-Nanotube FET Circuits: Today’s Challenges and the Road Ahead
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报告开始:2021年08月20日 09:45(Asia/Shanghai)

报告时间:45min

所在会场:[PS] Plenary Session(Openning, Keynotes 1-6) [PS2] Keynote 4/5/6

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摘要
Carbon-Nanotube FETs (CNFETs) are potential successors to CMOS transistors; these emerging devices have low intrinsic delay owing to near-ballistic transport in carbon nanotubes (CNTs). As CNFETs are evaluated for circuit/system design, it is important to analyze the process variations and manufacturing defects in CNFETs. In this talk, we systematically characterize the impact of such imperfections in a hierarchical fashion – at the transistor-level, gate-level, and the system-level. Our approach identifies critical device parameters that have maximum impact on the CNFET performance. We explore the challenges in delay testing of CNFET circuits in the presence of these process variations and propose a new variation-aware test generation method that outperforms existing ATPG methods. We also show how imperfect CNT deposition during CNFET fabrication can lead to the formation of difficult-to-etch CNT aggregates in the active layer. These CNT aggregates can form parasitic CNFETs (para-FETs) that lead to conditional shorts and stuck-at faults. We propose ParaMitE, a layout optimization method that horizontally flips selected standard cells in situ to minimize the number of para-FETs. Our work identifies and mitigates several challenges that need to be addressed before CNFET-based high-volume production can appear in industry roadmaps.
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报告人
Chakrabarty Krishnendu
Professor Duke University

Prof. Krishnendu Chakrabarty, Duke University
Krishnendu Chakrabarty received the B. Tech. degree from the Indian Institute of Technology, Kharagpur, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, in 1992 and 1995, respectively. He is now the John Cocke Distinguished Professor and Department Chair of Electrical and Computer Engineering (ECE), and Professor of Computer Science, at Duke University. Prof. Chakrabarty is a recipient of the National Science Foundation CAREER award, the Office of Naval Research Young Investigator award, the Humboldt Research Award from the Alexander von Humboldt Foundation, Germany, the IEEE Transactions on CAD Donald O. Pederson Best Paper Award (2015), the IEEE Transactions on VLSI Systems Prize Paper Award (2021), the ACM Transactions on Design Automation of Electronic Systems Best Paper Award (2017), multiple IBM Faculty Awards and HP Labs Open Innovation Research Awards, and over a dozen best paper awards at major conferences. He is also a recipient of the IEEE Computer Society Technical Achievement Award (2015), the IEEE Circuits and Systems Society Charles A. Desoer Technical Achievement Award (2017), the IEEE Circuits and Systems Society Vitold Belevitch Award (2021), the Semiconductor Research Corporation Technical Excellence Award (2018), and the IEEE Test Technology Technical Council Bob Madge Innovation Award (2018). He is a Research Ambassador of the University of Bremen (Germany) and he was a Hans Fischer Senior Fellow at the Institute for Advanced Study, Technical University of Munich, Germany during 2016-2019. He is a 2018 recipient of the Japan Society for the Promotion of Science (JSPS) Invitational Fellowship in the “Short Term S: Nobel Prize Level” category.
Prof. Chakrabarty’s current research projects include: design-for-testability of integrated circuits and systems (especially 3D integration and system-on-chip); microfluidic biochips; hardware security; neuromorphic computing systems; machine learning for fault diagnosis, failure prediction, healthcare, and biochemical analysis. He is a Fellow of ACM, IEEE, and AAAS, and a Golden Core Member of the IEEE Computer Society. Prof. Chakrabarty served as the Editor-in-Chief of IEEE Design & Test of Computers during 2010-2012, ACM Journal on Emerging Technologies in Computing Systems during 2010-2015, and IEEE Transactions on VLSI Systems during 2015-2018.

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重要日期
  • 会议日期

    08月18日

    2021

    08月20日

    2021

  • 05月10日 2021

    初稿截稿日期

  • 08月16日 2021

    提前注册日期

  • 08月19日 2021

    报告提交截止日期

  • 08月20日 2021

    注册截止日期

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