活动简介

With the test technology facing its grand challenges to ensure the quality of ICs and electronic systems incorporating more and more sophisticated manufacturing processes and system integration technologies in various emerging applications such as Internet of Things, cloud computing, automotive electronics, etc., global proliferation and cooperation is increasingly more important. International Test Conference has been a flagship conference in test technology since 1970. With an attempt to stimulate more discussion and interaction between the academia and the industry around the globe, ITC-Asia was initiated and co-located with SEMICON Taiwan in Taipei. Attendee can involve themselves in not only the state-of-the-art test technology trend, but also numerous semiconductor industry forums organized by SEMICON Taiwan.

征稿信息

征稿范围

  • Design Validation and Debug
  • Hardware Oriented Security and Trust
  • ATE Design
  • Analog and Mixed-Signal Test
  • RF Test
  • High-Speed I/O Test
  • Fault Modeling and Simulation
  • ATPG (Automatic Test Pattern Generation)
  • Design for Testability for Logic Circuits
  • Built-In Self-Test for Logic Circuits
  • Delay Test
  • System-on-Chip Test
  • Test Compression
  • Test Methods for Low-Power Circuits
  • Power-Aware and/or Thermal-Aware Test
  • Memory Test, Diagnosis, and Repair
  • Fault Diagnosis and Failure Analysis
  • Test Methods for Emerging Devices
  • MEMS Test
  • Sensor Test
  • GPU Test
  • Multi-Core Microprocessor Test
  • Automotive IC Test
  • Online Test
  • On-Chip Measurement
  • Reliability Issues
  • SiP, 2.5D, and 3D IC Test
  • Interconnect Test
  • Test Standards
  • Test Economics
  • Fault Tolerance
  • Reconfigurable System Test
  • Board-Level Testing and Diagnosis
  • Yield Analysis and Learning

作者指南

Regular paper submissions should be made electronically by PDF manuscripts only, not exceeding 6 pages in IEEE 2-column format (including abstract, figures, tables, and bibliography). A submission will be considered evidence that upon acceptance at least one author will attend the conference to make the presentation. Authors of accepted papers are also responsible for preparing the final manuscripts in time to be included in the electronic proceedings, which will eventually be published in IEEE Xplore Digital Library. At least one registration to the conference is required for each accepted paper.

留言
验证码 看不清楚，更换一张
全部留言
重要日期

  • 会议日期

    09月13日

    2017

    至

    09月15日

    2017

  • 09月15日 2017

    注册截止日期

联系方式
登录查看完整联系方式
历届会议
移动端
在手机上打开
小程序
打开微信小程序
客服
扫码或点此咨询