Prof. Hung-Pin (Charles) Wen received the Ph.D. degree in very large-scale integration (VLSI) verification and test from the University of California at Santa Barbara, Santa Barbara, CA, USA, in 2007. He is currently a Distinguished Professor (2020-now) with National Yang Ming Chiao Tung University, Hsinchu, Taiwan, where he is also a specialist in computer engineering. Over the past few years, his research has been focused on applying machine learning and data mining to system-on-chip designs (including radiation hardening, functional verification, and timing analysis) and cloud networking (especially on performance analysis and architecture design of large-scale data centers). Prof. Wen was a recipient of the Best Paper Awards from the 2012 Asia and South Pacific Design Automation Conference (ASP-DAC), the 2014 Synthesis And System Integration of Mixed Information (SASIMI), the 2016 International Conference on Information Networking (ICOIN), the 2017 ICOIN, and the Distinguished Young Scholar Award of the Taiwan IC Design Society.
08月18日
2021
08月20日
2021
初稿截稿日期
提前注册日期
报告提交截止日期
注册截止日期
2022年08月24日 台湾-中国 Taipei
2022 IEEE International Test Conference in Asia2019年09月03日 日本 Tokyo
2019 IEEE International Test Conference in Asia2018年08月15日 中国
2018 IEEE International Test Conference in Asia2017年09月13日 台湾-中国 Taipei
2017 IEEE International Test Conference in Asia2014年11月10日 中国 杭州市
IEEE International Test Conference in Asia
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