报告详情
Rigorous Test Flow for PLL to Identify Weak Devices
编号：65
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更新：2021-08-18 20:53:04
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口头报告
摘要
Presenter: Prof. Shi-Yu Huang, National Tsing Hua University, Taiwan
Education:
BS, EE Dept., National Taiwan University, 1988
MS, EE Dept., National Taiwan University, 1992
Ph.D., ECE Dept., Univ. of Santa Barbara, 1997
Experience:
Joined National Tsing Hua University since 1999
Current Research Interests:
Cell-based Timing Circuit Design and Compiler,
and their applications for VLSI Testing and Online Monitoring.
Education:
BS, EE Dept., National Taiwan University, 1988
MS, EE Dept., National Taiwan University, 1992
Ph.D., ECE Dept., Univ. of Santa Barbara, 1997
Experience:
Joined National Tsing Hua University since 1999
Current Research Interests:
Cell-based Timing Circuit Design and Compiler,
and their applications for VLSI Testing and Online Monitoring.
关键词
暂无
报告人
Shi-Yu Huang
National Tsing Hua UniversityPresenter: Prof. Shi-Yu Huang, National Tsing Hua University, Taiwan
Education:
BS, EE Dept., National Taiwan University, 1988
MS, EE Dept., National Taiwan University, 1992
Ph.D., ECE Dept., Univ. of Santa Barbara, 1997
Experience:
Joined National Tsing Hua University since 1999
Current Research Interests:
Cell-based Timing Circuit Design and Compiler,
and their applications for VLSI Testing and Online Monitoring.
全部评论
重要日期
-
会议日期
08月18日
2021
至08月20日
2021
-
05月10日 2021
初稿截稿日期
-
08月16日 2021
提前注册日期
-
08月19日 2021
报告提交截止日期
-
08月20日 2021
注册截止日期
主办单位
IEEE
Tongji University
Chinese Computer Federation
Tongji University
Chinese Computer Federation
承办单位
Tongji University
联系方式
- Prof. Zhang Ying
- yi******@tongji.edu.cn
历届会议
-
2022年08月24日 台湾-中国 Taipei
2022 IEEE International Test Conference in Asia -
2019年09月03日 日本 Tokyo
2019 IEEE International Test Conference in Asia -
2018年08月15日 中国
2018 IEEE International Test Conference in Asia -
2017年09月13日 台湾-中国 Taipei
2017 IEEE International Test Conference in Asia -
2014年11月10日 中国 杭州市
IEEE International Test Conference in Asia
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