Dr. Adit Singh is Godbold Endowed Chair Professor of Electrical and Computer Engineering at Auburn University, where he has served on the faculty since 1991. Earlier he has held faculty positions at the University of Massachusetts in Amherst, and Virginia Tech, in Blacksburg. He has also held visiting professorships at the University of Freiburg, Germany, and the University of Tokyo, Japan, and a Fulbright at the University Polytechnic of Catalonia in Barcelona, Spain. His research interests span all aspects of VLSI technology, with an emphasis on IC test and reliability; he has published widely in these areas. Professor Singh has held leadership roles as General Chair/Co-Chair/Program Chair for dozens of VLSI design and test conferences, and regularly serves on the Steering and Program Committees of many major international conferences in test and design automation. For two terms (2007-11), he was elected Chair of the IEEE Test Technology Technical Council (TTTC), and also served (2011-2015) on the Board of Governors of the IEEE Council on Design Automation (CEDA). He holds a B.Tech in Electrical Engineering from IIT Kanpur, and the M.S. and Ph.D. from Virginia Tech. He was elected Fellow of IEEE in 2002.
08月18日
2021
08月20日
2021
初稿截稿日期
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2022年08月24日 台湾-中国 Taipei
2022 IEEE International Test Conference in Asia2019年09月03日 日本 Tokyo
2019 IEEE International Test Conference in Asia2018年08月15日 中国
2018 IEEE International Test Conference in Asia2017年09月13日 台湾-中国 Taipei
2017 IEEE International Test Conference in Asia2014年11月10日 中国 杭州市
IEEE International Test Conference in Asia
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