报告清单

[61]Parallel DICE Cells and Dual-Level CEs based3-Node-Upset Tolerant Latch Design for Highly Robust Computing

Aibin Yan Associate professor Anhui University

RS /RS3 2021年08月20日 11:30~11:50

公开口头报告

[60]Developing Formal Models for Measuring Fault Effects Using Functional EDA Tools

Lingjuan Wu Associate Proferssor huazhong agricultural university

RS /RS2 2021年08月19日 21:05~21:25

公开口头报告

[59]An SRAM Test Quality Improvement Method For Automotive chips

Tuanhui Xu employees

IS /IS4 2021年08月20日 20:00~20:20

仅限参会人口头报告

[58]A Duty-Cycle Monitor Supporting A Wide Frequency Range of Clock Signal

Chen-Lin Tsai NTHU

RS /RS2 2021年08月19日 21:45~22:05

仅限参会人口头报告

[56]A Dynamic Memory Maintenance Model Based on Physical Architecture

Shixin Xu Duke Kunshan Universit

IS /IS4 2021年08月20日 20:20~20:40

仅限参会人口头报告

[55]High-speed measurement of Piezoelectric MEMS equivalent circuit parameters by Swept-sine and PRBS signals

Mitsuo Matsumoto Expert Engineer Advantest Corporation

RS /RS3 2021年08月20日 11:50~12:10

公开口头报告

[54]TAIWAN Online: Test AI with AN Codes Online for Automotive Chips

Tsung-Chu Huang Professor National Changhua University of Education

SS /SS4 2021年08月20日 21:05~21:25

仅限参会人口头报告

[52]Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal Probability

Zhen Wang Associate Professor Shanghai University of Electric Power

RS /RS3 2021年08月20日 12:10~12:30

公开口头报告

[51]Use Machine Learning Based Smart Sampling to Improve System Level Testing Efﬁciency 

Chenwei Liu Huawei Technology Co., Ltd.

RS /RS1 2021年08月19日 20:00~20:20

仅限参会人口头报告

[50]Kelvin Bridge Structure Based TSV Test for Weak Faults

Hao Chang Anhui University of Finance & Economics

SS /SS1 2021年08月19日 20:20~20:40

仅限参会人口头报告

2021 IEEE International Test Conference in Asia (ITC-Asia 2021)

[61]Parallel DICE Cells and Dual-Level CEs based3-Node-Upset Tolerant Latch Design for Highly Robust Computing

[60]Developing Formal Models for Measuring Fault Effects Using Functional EDA Tools

[59]An SRAM Test Quality Improvement Method For Automotive chips

[58]A Duty-Cycle Monitor Supporting A Wide Frequency Range of Clock Signal

[56]A Dynamic Memory Maintenance Model Based on Physical Architecture

[55]High-speed measurement of Piezoelectric MEMS equivalent circuit parameters by Swept-sine and PRBS signals

[54]TAIWAN Online: Test AI with AN Codes Online for Automotive Chips

[52]Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal Probability

[51]Use Machine Learning Based Smart Sampling to Improve System Level Testing Efﬁciency

[50]Kelvin Bridge Structure Based TSV Test for Weak Faults

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