活动简介
trends and novel concepts in testing, debug and repair of microelectronic circuits and systems. The VTS Program Committee invites original, unpublished paper submissions for VTS 2014. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.
征稿信息

重要日期

2013-10-18
摘要截稿日期

征稿范围

Major topics include, but are not limited to: Analog, Mixed-Signal & RF Test ATPG & Compression ATE Architecture & Software Built-In Self-Test (BIST) Defect & Current Based Test Defect/Fault Tolerance Delay & Performance Test Design fo
留言
验证码 看不清楚,更换一张
全部留言
重要日期
  • 会议日期

    04月13日

    2014

    04月17日

    2014

  • 10月18日 2013

    摘要截稿日期

  • 04月17日 2014

    注册截止日期

主办单位
IEEE Computer Society
联系方式
历届会议
扫码在手机浏览×