2021 IEEE 39th VLSI Test Symposium VTS

活动简介

The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in test, validation, yield, reliability and security of microelectronic circuits and systems.

The 2021 edition of VTS will be an online virtual interactive live event.

The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions and Innovative Practices sessions.

Sponsor Type:1; 3

组委会

General Co-Chairs:

Lorena Anghel
University of Grenoble-Alpes/PHELMA

Stefano Di Carlo
Politecnico di Torino

Program Co-Chairs:

Mehdi Tahoori
Karlsruhe Institute of Technology

Suriyaprakash Natarajan
Intel

Past Chair:

Amit Majumdar
Xilinx

Vice General Co-Chair:

Peilin Song
IBM Research

Vice Program Co-Chair:

Sule Ozev
Arizona State University

Innovative Practices Co-Chair:

Arani Sinha
Intel

Marc Hutner
Teradyne

Special Sessions Co-Chairs:

Naghmeh Karimi
University of Maryland, Baltimore County

Gurgen Harutyunyan
Synopsys

Huawei Li
Chinese Academy of Sciences

New Initiatives Co-Chairs:

Xiaowei Li
Chinese Accademy of Science

New Topics Co-Chairs:

Bernard Courtois
BC Consulting

Bozena Kaminska
Simon Fraser University

Finance Chair:

Chintan Patel
Univ. of Maryland Baltimore County

Registration Chair:

Ke Huang
San Diego State University

Publications Co-Chairs:

avatarmaleAlberto Bosio
Ecole Centrale de Lyon

Kanad Basu
UT Dallas

Media Co-Chairs:

Alessandro Savino
Politecnico di Torino

Marcello Traiola
Ecole Centrale de Lyon

Ex-Officio:

Yervant Zorian
Synopsys

Student Activities Chair:

Ujjwal Guin
Auburn University

征稿信息

重要日期

2020-11-29

摘要截稿日期

征稿范围

Analog, Mixed-Signal, RF Test
ATPG & Compression
Silicon Debug
Automotive Test & Safety
Built-In Self-Test (BIST)
Defect & Current Based Test
Defect & Fault Tolerance
Delay & Performance Test
Design for Testability, Yield or Reliability
Pre-silicon Design Verification & Validation
Post-silicon Validation
Embedded System & Board Test
Embedded Test Methods
Emerging Technologies Test and Reliability
FPGA Test
Fault Modeling and Simulation
Hardware Security
Low-Power IC Test
Machine Learning in Test,Yield and Reliability
Microsystems/MEMS/Sensors Test
Memory Test and Repair
On-Line Test & Error Correction
Power & Thermal Issues in Test
System-on-Chip (SOC) Test
Test & Reliability of Biomedical Devices
Test & Reliability of High-Speed I/O
Test & Reliability of Machine Learning Systems
Test Quality & Reliability
Test Standards & Economics
Test Resource Partitioning
Transient & Soft Errors
2.5D, 3D & SiP Test
Yield Optimization