活动简介

About Components, Circuits, Devices and Systems
Keywords:Design for testability,Circuit testing,Automatic Test Equipment,Design and test for Computers,Built-in Self-Test,Semiconductor Device Testing,
Scope:The Premier IEEE Symposium will bring together scientists, academics, and practicing engineers from all over the world to explore emerging trends and novel concepts in testing, and verification & validation of microelectronic circuits and systems, the aim of this conference is to provide an international forum for these experts to promote, share, and discuss various issues and developments in the growing filed of VLSI Test.
Sponsor Type:1; 3

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重要日期
  • 会议日期

    04月23日

    2023

    04月26日

    2023

  • 04月26日 2023

    注册截止日期

主办单位
IEEE Computer Society Philadelphia Section
联系方式
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