International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design- fortest, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. At ITC, design, test, and yield professionals can confront challenges faced by the industry, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.
ITC, the cornerstone of the Test Week event, offers a wide variety of technical activities targeted at test and design theoreticians and practitioners, including: formal paper sessions, tutorials, panel sessions, case studies, invited lectures, commercial exhibits and presentations, and a host of ancillary professional meetings.
Authors are invited to submit original, unpublished papers describing recent work in the field of test and design. In addition, authors are invited to submit high quality, practical, industry best practices. Submissions simultaneously under review or accepted by another conference, symposium or journal, will be summarily rejected.
3D/2.5D Test
Adaptive Test in Practice
ATE/Probe Card Design
Advances in Boundary Scan
Bring-Up
Data-driven Methods
Data Exchange and Infrastructure
Defect-oriented Testing
DFM and Test
Diagnosis
Economics of Test
End-to-End Data Analysis
End-to-End System Security
Embedded BIST and DFT
Emerging Defect Mechanisms
Hardware Security and Trust
IoT Testing
Jitter, High-Speed I/O and RF Test
Known-Good-Die testing
Memory Test and Repair
MEMS Testing
Mixed-Signal and Analog Test
New Technologies and Test
On-Chip Test Compression
Online Test
Pre-Silicon Verification
Post- Silicon Validation
Power Issues in Test
Protocol-aware Test
Reliability and Resilience
Scan Based Test
SoC/SiP/NoC Test
Silicon Debug
Simulation and Emulation
System Test (Applications)
System Test (Hardware/Software)
Test-to-Design Feedback
Test Escape Analysis
Test Flow Optimizations
Test Generation and Validation
Test Resource Partitioning
Test Standards
Test Time Analysis and Reduction
Testing High Speed Optics/Photonics
Timing Test
Yield Analysis and Optimization
10月30日
2018
11月03日
2018
摘要截稿日期
初稿截稿日期
初稿录用通知日期
终稿截稿日期
注册截止日期
2020年11月01日 美国
2020 IEEE International Test Conference2019年11月09日 美国
2019 IEEE International Test Conference2017年10月31日 美国
2017年IEEE国际测试会议2016年11月15日 美国 Fort Worth,USA
2016年IEEE测试国际会议2015年10月06日 美国
2015年IEEE测试国际会议2014年10月20日 美国
2014年IEEE测试国际会议2013年09月06日 美国
2013年IEEE国际测试大会
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