活动简介

International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

征稿信息

重要日期

2017-03-20
摘要截稿日期
2017-03-20
初稿截稿日期
2017-06-10
初稿录用日期
2017-07-05
终稿截稿日期

征稿范围

Topics of interest include (not limited to): 

  • 3D/2.5D Test
  • Adaptive Test in Practice
  • ATE/Probe Card Design
  • Advances in Boundary Scan
  • Bring Up
  • Data Driven Methods
  • Data Exchange and Infrastructure
  • Defect-Oriented Testing
  • DFM and Test
  • Diagnosis
  • Economics of Test
  • End-to-End Data Analysis
  • Embedded BIST & DFT
  • Emerging Defect Mechanisms
  • Hardware Security and Trust
  • IoT Testing
  • Jitter, High-Speed I/O and RF Test
  • Known-Good-Die testing
  • Memory Test and Repair
  • MEMS Testing
  • Mixed-Signal and Analog Test
  • New Technologies and Test
  • On-Chip Test Compression
  • Online Test
  • Pre- and Post- Silicon Validation
  • Power Issues in Test
  • Protocol-aware Test
  • Reliability and Resilience
  • Scan Based Test
  • SoC/SiP/NoC Test
  • Silicon Debug
  • Simulation and Test
  • System Test (Applications)
  • System Test (Hardware/Software)
  • Test-to-Design Feedback
  • Test Escape Analysis
  • Test Flow Optimizations
  • Test Generation and Validation
  • Test Resource Partitioning
  • Test Standards
  • Test Time Analysis and Reduction
  • Testing High Speed Optics/Photonics
  • Timing Test
  • Yield Analysis and Optimization
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重要日期
  • 会议日期

    10月31日

    2017

    11月02日

    2017

  • 03月20日 2017

    摘要截稿日期

  • 03月20日 2017

    初稿截稿日期

  • 06月10日 2017

    初稿录用通知日期

  • 07月05日 2017

    终稿截稿日期

  • 11月02日 2017

    注册截止日期

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IEEE Dallas Section
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