For 54 years, IRPS has been the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment.
IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world.
Gate Dielectrics
Back-End Reliability
Transistors
ESD and Latchup
Soft Errors
Memory
Product IC Reliability
Wide Band-Gap
Process Integration
Circuit Reliability
Circuit Aging Simulation
Consumer Electronics Reliability
Electronic System Reliability
3D Assembly
Packaging
MEMS
Beyond CMOS Devices
Failure Analysis
Photovoltaic Devices
04月02日
2017
04月06日
2017
初稿截稿日期
注册截止日期
2028年03月26日 美国 Monterey
2028 IEEE International Reliability Physics Symposium (IRPS)2021年03月21日 美国 Monterey
2021 IEEE International Reliability Physics Symposium2019年03月31日 美国
2019 IEEE International Reliability Physics Symposium2018年03月11日 美国
2018 IEEE International Reliability Physics Symposium2016年04月17日 美国 Pasadena, CA, USA
2016年IEEE国际可靠性物理研讨会2015年04月19日 匈牙利
2015年IEEE国际可靠性物理研讨会2014年06月03日 美国
2014年IEEE国际可靠性物理研讨会2013年04月14日 美国
2013年IEEE国际可靠性物理研讨会
留言