On behalf of the Management Committee of the IEEE International Reliability Physics Symposium (IRPS) and the IRPS Board of Directors, it is my pleasure to welcome you to the IRPS 2015. In its 53 years, IRPS has established itself as the world抯 premier conference in microelectronics reliability and continues to attract engineers and scientists to present pioneering work in this field. The 2015 technical program consists of 94 platform and 73 poster presentations. In addition 14 invited talks will be given by experts in key areas of microelectronics reliability. New to this year抯 symposium is the introduction of a combined session on gate dielectric and BEOL/MOL TDDB with the intent to encourage sharing of common methodologies and modeling to improve reciprocal learning. In addition on Wednesday we have a guest speaker at lunch time. The symposium also includes 21 tutorials organized in three different technical tracks, three Reliability Year in Review talks, workshops as well as an equipment exhibit. There will be a lively poster reception on Wednesday and we are looking forward to seeing everyone along with their companions and family at this event. Every year at IRPS we strive to organize a symposium that is technical strong while offering a great attendees experience. We look forward to your survey feedback in continuing to keep this symposium a great experience in future years.