活动简介

For 52 years, IRPS has been the premier conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment. IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world. We look forward to seeing you in Hawaii!

征稿信息

征稿范围

Other opportunities at the symposium include: Two-Day Tutorial Program (Sunday-Monday June 1-2). The IRPS tutorial program is a comprehensive two-day event designed to help both the new engineer and experienced researcher. The tutorial program contains b
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重要日期
  • 会议日期

    06月03日

    2014

    06月06日

    2014

  • 06月06日 2014

    注册截止日期

主办单位
IEEE Electron Devices Society
IEEE Reliability Society
历届会议
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