AboutComponents, Circuits, Devices and Systems
Keywords:DefectAnalog and Mixed-Signal,RF and mmWave,High-Speed digital,MEMs and Microsystems,Jitter and Signal-Integrity Test,Emerging Technologies and Architectures,Functional Safety and Dependability,Infrastructure and Test Standards,Online Test and Fault Tolerance,Security and Trust,System Level Test and Diagnosis,Board Test,Embedded Test,Test generation,Test Compaction,Test Application and Evaluation,Validation and Verification,In-memory Computing,Quantum and Reversible C&A,Fault Modeling and Simula
Scope:The IEEE European Test Symposium (ETS) is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing, reliability, security and validation.
Sponsor Type:1; 1; 9