The areas of interest include (but are not limited to) the following topics:

➢Analog, Mixed-Signal and RF Test
➢Approximate Circuit Testing
➢ATE Hardware and Software
➢Automatic Test Generation
➢Automotive and Avionics Test
➢Board Test and Diagnosis
➢Built-In Self-Test
➢Current-Based Test
➢Defect-Based Test
➢Delay and Performance Test
➢Dependability and Functional Safety
➢Design for Test
➢DfX (Design for Manufacturing, Reliability, Yield, etc.)
➢Diagnosis and Silicon Debug
➢Economics of Test
➢Failure Analysis
➢Fault Modeling and Simulation
➢Fault Tolerance
➢Hardware Security
➢Hardware Trust
➢High-Speed I/0 Test
➢Low-Power Test
➢Machine Learning and AI for Test
➢Memory Test and Repair
➢Microsystems / MEMS / Sensors Test
➢On-Line Test
➢Power- / Thermal-Aware Test
➢Processor Test (Multi-Core, GPU, CPU, Neuromorphic, etc.)
➢Security Issues in Test
➢Self-X (Awareness, Repair, Test, etc.)
➢Signal Integrity Test
➢SoC and NoC Test
➢Stacked or 3D ICs Test
➢Standards in Test
➢Test of Reconfigurable Systems(FPGA, CPLD, etc.)
➢Test, Reliability and Security of Emerging Technologies
➢Test, Reliability and Security of Emerging Computing (Neuromorphic, In-Memory, Reversible and Quantum Circuits, etc.)
➢Trojan Detection
➢Verification and Validation
➢Yield Analysis and Enhancement