活动简介

Sponsored by the IEEE's CPMT Society, ITherm 2018 is an international conference for scientific and engineering exploration of thermal, thermomechanical and emerging technology issues associated with electronic devices, packages and systems. The first ITherm Conference was held in 1988, making this the 30th year of the Conference Series. ITherm 2018 will be held along with the 66th Electronic Components and Technology Conference (ECTC 2018 - http://www.ectc.net), a premier electronics packaging conference at the Sheraton Hotel and Marina in San Diego. Joint registrations are available at a discounted rate. In addition to paper presentations and vendor exhibits, ITherm 2018 will have panel discussions, keynote lectures by prominent speakers, invited Tech Talks, and professional short courses.

征稿信息

重要日期

2017-09-04
摘要截稿日期
2017-12-18
初稿截稿日期
2018-02-05
初稿录用日期
2018-03-05
终稿截稿日期

征稿范围

Original papers are solicited in the following general areas of interest (but not limited to):

Component-Level Thermal Management

  • Single/Multi Chip Module & System in Package

  • 3D Packaging & Embedded Cooling

  • Hotspot & Impingement Cooling

  • Passive Two-Phase Cooling: Heat Pipes, Vapor Chambers, & Thermosyphons

  • Pulsating/Oscillating & Non-conventional Heat Pipes

  • Thermal Interface Materials and Heat Spreaders

  • Thermoelectricity & Peltier Devices

  • Novel Air Cooling Techniques & Heat Exchangers

  • Pumps, Compressors, Fans & Blowers

  • Single-Phase Liquid & Two-Phase Cold Plates

  • Boiling/Evaporation/Condensation, Microgap Cooling

System-Level Thermal Management

  • Data Center Energy Efficiency

  • Thermal Storage

  • Immersion Cooling, Refrigeration

  • Mobile, Internet of Things, MEMS

  • Telecommunication Systems

  • Automotive

  • Space and Aerospace

  • Power Electronics

  • LEDs

  • Photovoltaics

  • RF Electronics

  • Batteries

Mechanics & Reliability

  • Thermo-Mechanical Modeling and Simulation of Devices,

  • Components, Boards, and Systems

  • Mechanics and Reliability of Solder Joints & Interconnects

  • Materials Characterization, Processing, Constitutive Models

  • Failure Mechanics, Fatigue, Damage Modeling

  • Experimental Techniques for Packaging Deformations, Strains, and Stresses

  • Shock, Drop, and Vibrational Analysis of Packages, Sub- Systems, and Systems

  • TSV / 3D Reliability and Packaging Challenges

  • Mechanics Issues in Assembly and Manufacturing

  • Applied Reliability for Failure Detection and Characterization

  • Process-Structure-Property Correlations / Multi-Scale

  • Analyses for Degradation and Failure

  • Accelerated Stress Testing and Modelling

  • Lifetime Prognostics and Condition Monitoring

Emerging Technologies and Fundamentals

  • Numerical Methods from Nano-to-Macro Scale

  • Experimental Methods from Nano-to-Macro Scale

  • Nanotechnology Including 1-D and 2-D Materials

  • Thermal Interface Materials and Phase Change Materials

  • Embedded Cooling

  • Transistor Technology

  • Novel Materials and Fabrication Techniques

  • Measurement and Instrumentation Techniques

  • Prognostic Health Management and Reliability Analysis

  • Flexible Electronics

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重要日期
  • 会议日期

    05月29日

    2018

    06月01日

    2018

  • 09月04日 2017

    摘要截稿日期

  • 12月18日 2017

    初稿截稿日期

  • 02月05日 2018

    初稿录用通知日期

  • 03月05日 2018

    终稿截稿日期

  • 06月01日 2018

    注册截止日期

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