Major topics include, but are not limited to:

• Automatic Test Pattern Generation (ATPG)

• Analog Test / Mixed-Signal Test

• Boundary Scan Test

• Board and System Test

• Built-In Self-Test

• Design for Testability (DFT)

• Design Verification and Validation

• Defect-Based Testing

• Delay and Performance Test

• Diagnosis and Debug

• Dependable System

• Economics of Test

• Fault Modeling and Simulation

• Fault Tolerance

• High-Speed I/O Test / RF Testing

• Memory Test / FPGA Test

• On-Line Test

• System-on-a-Chip Test

• System-in-package (SiP) / 3D Test

• Software Testing / Software Design for Testing

• Test Compression

• Temperature / Power-aware Test

• Test Quality

• Yield Analysis and Enhancement