The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.
The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.
Analog/Mixed-Signal Test
Automatic Test Generation
Board Test and Diagnosis
Boundary Scan Test
Built-In Self-Test (BIST)
Defect-Based Test
Delay and Performance Test
Dependability and Functional Safety
Design for Test (DFT)
Diagnosis and Silicon Debug
Economic of Test
Failure Analysis
Fault Modeling and Simulation
Fault Tolerance
GPU Test
High-Speed I/O Test
Low-Power IC Test
Memory Test and Repair
MEMS Test
Multi-/Many-core Processor Test
Nanotechnology Test
On-line Test
Power/Thermal/Reliability Issues in Test
Reconfigurable System Test
Reliability
RF Test
Hardware-oriented Security and Trust
Self-Repair
Sensor Test
SiP, Stacked, 3D IC Test
SoC Test
Standards in Test
Statistical Learning in Test
Test Compression
Test Quality
Test Synthesis
Validation and Verification
Yield Analysis and Enhancement
10月15日
2018
10月18日
2018
初稿截稿日期
注册截止日期
2024年12月17日 印度 Ahmedabad
The 33rd IEEE Asian Test Symposium (ATS 2024)2023年10月14日 中国 Beijing
2023 IEEE 32nd Asian Test Symposium2022年11月21日 台湾-中国 Taichung City
2022 IEEE 31st Asian Test Symposium2017年11月27日 中国 Taipei,China
2017 IEEE 26th Asian Test Symposium2016年11月21日 日本 Hiroshima,Japan
2016年第25届IEEE亚洲测试研讨会2013年11月18日 台湾-中国
2013年第22届亚洲测试研讨会
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