Original papers are solicited presenting new developments in topics relevant to ICMTS, including but not limited to, test structures, measurements, and results, in the following areas:

Design

Methodologies, Verification
Within-die circuits for process characterization/monitoring
Design enablement – Characterization and validation of digital and analog libraries
Devices and Circuit Modeling

Measurement techniques

DC, AC and RF measurements: setup, test and analysis
Reliability test - including thermal stability, failure analysis, prediction, etc.
Statistical analysis, variability, throughput increase, smart test strategies
Use of machine learning and AI in analysis of data sets - parameter extraction etc.
Wafer probing, within-die measurements, in-line metrology
Throughput, testing strategies, yield enhancement and process control tests

Applications

Emerging memory technologies (single cell, arrays, and application in neural networks)
Emerging transistor technologies for digital/analog/power applications
Photonic devices - silicon integration, new displays (OLED, ?-displays)
Flexible electronics and sensors (organic and inorganic materials)
M(N)EMS, actuators, sensors, PV cells and other emerging devices