To cope with the rapidly progressing technology which, today, reaches the nanometer scale. The areas of interest include the design, test and technology of electronic products, ranging from integrated circuit modules and printed circuit boards to full systems and microsystems, as well as the methodologies and tools used in the design, verification and validation of such products.
Aim of the Conference: to cope with the rapidly progressing technology which, today, reaches the nanometer scale. The areas of interest include the design, test and technology of electronic products, ranging from integrated circuit modules and printed circuit boards to full systems and microsystems, as well as the methodologies and tools used in the design, verification and validation of such products. Topics of the conference include, but are not limited to:
Integrated Systems Design: | Integrated Systems Technology: | Integrated Systems Testing: |
• SOC, SIP design | • Nanoelectronics | • Defect and fault modeling |
• Multiprocessor systems | • Device modeling | • Analog and Mixed Signal testing |
• Embedded systems | • Material characterization | • MEMS/MOEMS testing |
• Wireless systems | • Failure analysis | • SOC and SIP testing |
• Network on Chip | • New components | • Delay testing |
• Analog, Mixed Signal and RF systems | • Packaging | • Memory testing |
• MEMS and MOEMS systems | • Process technology | • Fault Simulation, ATPG |
• Low Voltage and Low Power systems | • Reliability issues | • DFT, BIST and BISR |
• Innovative technologies | • 3D integration | • On-line testing and fault tolerant systems |
• Synthesis (physical, logic) | • ATE issues | |
• Simulation, Validation and Verification | • Alternative test strategies | |
• 3D integration | • 3D testing | |
• Hardware Security | • Test and Security Issues | |
• FPGA design |
04月09日
2018
04月12日
2018
摘要截稿日期
初稿截稿日期
初稿录用通知日期
终稿截稿日期
注册截止日期
2017年04月04日 西班牙 Majorca,Spain
2017年第12届纳米时代集成系统设计与技术国际会议2015年04月21日 意大利
2015年第10届纳米时代集成系统设计与技术国际会议
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