Analysis of Spectral Calibration Correction Based on Mie Scattering
International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence
Yu Qi  University of Chinese Academy of Sciences
P5 /P5-2 2024年11月02日 11:50~12:10
仅限参会人 口头报告
Capacitor array bonding defect detection based on active infrared thermography
International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence
Huang Yifan  Huazhong University of Science and Technology
P5 /P5-1 2024年11月01日 14:40~15:00
仅限参会人 口头报告
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