2016年第27届SEMI先进半导体制造会议 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference ASMC

活动简介

ASMC continues to provide semiconductor professionals with an unparalled opportunity to network and learn the latest information in the practical application of advanced manufacturing strategies and methodologies. ASMC 2016 features technical sessions highlighting strategic manufacturing issues, as well as insightful keynotes, provocative panel discussion, and an informative tutorial.

征稿信息

征稿范围

Session1 Contamination Free Manufacturing (CFM)
Session 2 Advanced Metrology
Session 3 Defect Inspection
Session 4 Factory Optimization
Session 5 Poster Session
Session 6 Defect Inspection II
Session 7 Advanced Equipment and Materials Processes
Session 8 Yield Enhancement/Yield Learnin
Session 9 Advanced Equipment / CFM
Session 10 Advanced Patterning
Session 11 Advanced Process Control (APC)
Session 12 Advanced Metrology
Session 13 Factory Optimization
Session 14 Yield Enhancement
Session 15 3D/TSV