The ESD Association is requesting abstracts for technical papers covering the effects of electrostatic discharge (ESD), electrical overstress (EOS), and static electricity for presentation at the 37th Annual EOS/ESD Symposium, September 27-October 2, 2015 at the Peppermill Resort and Casino, Reno, NV, USA. Papers for the EOS/ESD Symposium should deal with work in the following areas: Advanced CMOS (Analog/Digital) EOS/ESD and Latchup, ESD Protection in Bipolar, RF, High Voltage and BCD Technologies, Numerical Modeling and Simulation for On-Chip ESD Protection, EOS/ESD Failure Analysis, Troubleshooting and Case Studies, Device Testing: Testers, Methods and Correlation Issues, System Level EOS/ESD/EMC, HMM, EOS/ESD Factory Level, Control and Materials Technology, Chip/Module/Package EOS/ESD Electronic Design Automation. Paper submissions should include data and analysis that advance state-of-the-art knowledge, enhance or review general knowledge, or address new topics. The technical program committee especially encourages new areas and fields relevant to EOS and ESD.