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活动简介

The VLSI-DAT and the VLSI-TSA symposia are proud to create this annual platform for the latest technical exchanges and communications between experts from all over the world. For example, for the 2014 VLSI-DAT not only three leading thinkers in the industry were invited to deliver the joint plenary keynote speeches (including Dr. Ronald M. Martino of Freescale, Dr. Atul Tambe of IBM, and Dr. David Prutchi of Impulse Dynamics), but there were also two carefully planned joint invited sessions on day 1 and day 3 of the conference. Please click the spotlight for more information about the 2014 VLSI-DAT and the VLSI-TSA symposia. The 2015 International Symposium on VLSI Design, Automation and Test (2015 VLSI-DAT) will again be held in the Ambassador Hotel, Hsinchu, Taiwan during April 27-29, 2015. Organized by Industrial Technology Research Institute (ITRI) and technically cooperations with the Institute of Electrical and Electronics Engineers (IEEE), the 2015 VLSI-DAT provides excellent opportunities for close interactions between industrial and scientific researchers via presentations and discussions on innovations and achievements related to VLSI design, automation and test. In 2015, the VLSI-DAT and the VLSI-TSA will be held again in the same week with three-day overlap. In response to the need of interactions between the technology and design communities, delegates registered for either 2015 VLSI-DAT or 2015 VLSI-TSA will be able to attend the program of both symposia. Original unpublished papers are solicited. Accepted papers will be published by the IEEE and be included in IEEE eXplorer after being presented in the symposium. The 2015 VLSI-DAT and VLSI-TSA will feature three joint plenary sessions, two joint invited sessions, along with a luncheon talk. Specifically, the 2015 VLSI-DAT technical sessions including 3 plenary talks, 2 industry sessions, 2 special sessions , 3 parallel tutorials and regular paper presentations. In addition, the Best Paper Award for the 2014 VLSI-DAT Symposium will be presented at the opening of the symposium in 2015, and the Best Paper Award for the 2015 Symposium will again be selected during the conference. More details of the Symposium program will be released in January, 2015.

征稿信息

征稿范围

Original, unpublished papers on all aspects of VLSI design, automation and test are solicited, including but not limited to: DESIGN TOPICS RF, analog and mixed-signal circuits Sensors and interface circuits Memory circuits and systems Digital circuits and ASIC Communication circuits Multimedia processing circuits Biomedical circuits Energy-harvesting and power circuits SoC and NoC architectures CPU, DSP and multicore architectures Designs using novel technologies System-in-package design Ultra low-power circuits, architectures, and systems EDA TOPICS Logic and architecture synthesis Physical design and verification Design for manufacturability Power estimation and optimization Design verification Modeling and simulation Electronic System Level design Hardware-software co-design Embedded systems and software TEST TOPICS Test Generation and Test Compression Design-for-Testability and BIST RF, analog and mixed-signal test SOC and system level test Silicon debug and diagnosis 3D IC and interposer-based IC test Yield and reliability enhancement On-chip monitoring Adaptive test Test standards
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重要日期
  • 会议日期

    04月27日

    2015

    04月29日

    2015

  • 04月29日 2015

    注册截止日期

主办单位
Industrial Technology Research Institute
Taiwan DEPT. Industrial Technology
Ministry of Economic Affairs
Taiwan Education
Taiwan Ministry
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