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International Conference on Electronic Measurement & Instruments (ICEMI) is the world's premier conference, and is convened every two years. It dedicated to the electronic test of devices, boards and systems----covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. The purpose of the ICEMI is to provide excellent opportunities for scientists, engineers, and participants throughout the world to present the latest research results and to exchange their views or experience. The 12th International Conference on Electronic Measurement & Instruments (ICEMI) will be held on 16-19 July, 2015, in Qingdao, China.

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重要日期

2015-04-30
初稿截稿日期

征稿范围

The 12th International Conference on Electronic Measurement & Instruments (ICEMI) will be held on 16-19 July, 2015, in Qingdao, China. Prospective authors are invited to submit original, unpublished papers describing recent work in any of the following areas,but are not limited to: Measurement & Test Information Acquisition and Transmission □ Sensors and Transducers □ Non-electric Measurement □ Sensor Network □ Data Acquisition System and Technology □ Signal Transmission and Data Bus □ Networks in Test and Measurement □ IOT: Internet of Things □ Cyber Physical System Measurement & Test Information Processing □ Sensors Fusion □ Signal Analysis and Processing □ Image Processing □ Measurement System and Theory □ Measurement Error Theory □ Virtual Measurement □ Machine Learning and Pattern Recognition □ Intelligent Optimization and Applications □ Data Mining □ Massive Data Management and Analysis □ Modeling and Simulation □ Reconfigurable Computing Measurement, Instruments & Test □ Virtual Instrument □ Microprocessor and Embedded System □ VLSI Testing and Fault Diagnosis □ MEMS Instruments and Test System □ Testability and Built-in-test □ Electronic Instrument & Measurement System □ Optical Instrument & Measurement System □ Precision Instruments & Measurement System □ Scientific Experiment and Analytic Instrument □ Educational Instrument & Experimental System Software Technology □ Embedded System Software □ Test System Software □ Software Test and Reliability Condition Monitoring and Health Management □ System Condition Monitoring □ Component and System Reliability □ Component and System Fault Diagnosis □ Prognostics and Health Management □ System Health Management Calibration and Traceability □ Quantum standards to fundamental constants and the international system of units □ DC/Low Frequency measurement standards and calibration set □ High Frequency measurement standards and calibration set □ Calibration for electromagnetic properties of materials □ Uncertainty evaluation □ International or regional comparison Instrument & Measurement in Research & Engineering □ Simulation and Experimental Technology □ Physical, Chemical and Biological Field □ Material & Electro-mechanical Engineering □ Energy and Power Engineering □ Communication Technology □ Aerospace & Avionics & Navigation □ Automobile Engineering □ Environmental Engineering □ Biomedical Instrument and Application □ Bioassay □ Biometric □ Industrial Process Control □ Robots □ Safety Monitoring Instruments and Systems □ Others
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重要日期
  • 会议日期

    07月16日

    2015

    07月19日

    2015

  • 04月30日 2015

    初稿截稿日期

  • 07月19日 2015

    注册截止日期

主办单位
中国电子学会
IEEE北京分会
承办单位
中国电子学会测量与仪器委员会
西安电子科技大学
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