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The International Conference on Electronic Measurement & Instruments (ICEMI) is the world's premier conference, and is convened every two years. It dedicated to the electronic test of devices, boards and systems----covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. The purpose of the ICEMI is to provide excellent opportunities for scientists, engineers, and participants throughout the world to present the latest research results and to exchange their views or experience. The 11th International Conference on Electronic Measurement & Instruments (ICEMI) will be held on 16-19 August, 2013, in Harbin, China. Background The International Conference on Electronic Measurement & Instruments(ICEMI)is sponsored by Chinese Institute of Electronics and held every two years. As the world’s premier conference, ICEMI dedicated to the electronic test of devices, modules and systems which is covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. The purpose of the ICEMI is to provide excellent opportunities for scientists, engineers, and participants throughout the world to present the latest research results and to exchange their views or experience.

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The 11th International Conference on Electronic Measurement & Instruments (ICEMI) will be held on 16-19 August, 2013, in Chengdu, China. Prospective authors are invited to submit original, unpublished papers describing recent work in any of the follow
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重要日期
  • 会议日期

    08月16日

    2013

    08月19日

    2013

  • 08月19日 2013

    注册截止日期

主办单位
IEEE Beijing Section
Chinese Institute of Electronics (CIE)
承办单位
Measurement and Instrument Committee of CIE
Harbin Institute Of Technology
Journal of Electronic Measurement and Instrument
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