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活动简介
The 27th International Conference on Microelectronic Test Structures will be held in Udine, Italy, bringing together scientists, technicians, designers and users of characterization techniques and test structures to discuss recent developments and future directions. The conference will take place on March 25-27, 2014, preceded by a one-day Tutorial Short Course on Microelectronic Test Structures on March 24. A Best Paper award will be presented by the Technical Program Committee. An Equipment exhibition relating to electronic devices measurements and characterization techniques will be held during the conference days. Vendors and manufacturers interested to participate can mail Dr. Alain Toffoli (Exhibition chair) The conference will be technically sponsored by the IEEE Electron Devices Society.
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重要日期

2013-10-05
摘要截稿日期
2014-01-13
初稿截稿日期

征稿范围

Suggested topics include, but are not limited to: Characterization of new materials: Test structures and methods to evaluate new materials and devices, like graphene, CNTs. Test structure design methods: Design flows for automated design, verification s
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重要日期
  • 会议日期

    03月24日

    2014

    03月27日

    2014

  • 10月05日 2013

    摘要截稿日期

  • 01月13日 2014

    初稿截稿日期

  • 03月27日 2014

    注册截止日期

主办单位
IEEE Electron Devices Society
承办单位
University of Udine
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