活动简介

The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions The meeting is a IEEE conference, sponsored by the IEEE Electron Devices Society.

Sponsor Type:1

组委会

General Chair:

Brad Smith
NXP Semiconductors

Technical Program Chair:

Chadwin Young
University of Texas, Dallas

Tutorial Chair:

Matthew Rerecich
Samsung Austin Semiconductor, LLC

Equipment Exhibition Chair:

Garrett Tranquillo
Celadon Systems, Inc.

Local Arrangements:

Brad Smith
NXP Semiconductors
 

征稿信息

重要日期

2021-03-17
初稿截稿日期

征稿范围

Original papers are solicited presenting new developments in topics relevant to ICMTS, including but not limited to, test structures, measurements, and results, in the following areas:

• Design

o Methodologies, verification
o Within-die circuits for process characterization/monitoring
o Design enablement – Characterization and validation of digital and analog libraries

• Measurement techniques

o DC, AC and RF measurements: setup, test and analysis
o Reliability test - including thermal stability, failure analysis etc.
o Statistical analysis, variability, throughput increase, smart test strategies
o Use of machine learning and AI in analysis of data sets - parameter extraction etc.
o Wafer probing, within-die measurements, in-line metrology
o Throughput, testing strategies, yield enhancement and process control tests

• Applications

o Emerging memory technologies (single cell, arrays, and application in neural networks)
o Emerging transistor technologies for digital/analog/power applications
o Photonic devices - silicon integration, new displays (OLED, µ-displays)
o Flexible electronics and sensors (organic and inorganic materials)
o M(N)EMS, actuators, sensors, PV cells and other emerging device

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重要日期
  • 会议日期

    04月12日

    2021

    04月15日

    2021

  • 03月17日 2021

    初稿截稿日期

  • 03月23日 2022

    注册截止日期

主办单位
IEEE Electron Devices Society
联系方式
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