On the basis of understanding the failure mechanism of metallized film capacitors, this paper analyzes and expounds the obtained security evaluation model, and focuses on the safety evaluation model under different working conditions. Normally, a simulation experiment platform that conforms to various working conditions is frequently adopted, providing significant support for the acquisition of experimental data of metallized film dielectric capacitors, thereby establishing a capacitor security evaluation model with high-reliability. While a single factor, which occupies relative huge impact ratio, is studied, researchers usually utilize power-law and Arrhenius models to predict well the lifespan of metallized film capacitors. After examining the relevant literature toward the safe and reliable operation of film capacitors, it is exposed that actually the coupling between multiple factors ought to be adequately considered during the normal charging and discharging of the capacitor. Models such as failure model and multi-factor coupling will realize a better fitting effect on the life safety assessment of film capacitors.