773 / 2022-03-31 21:44:03
Development of a Stray Current Testing Device Based on Harmonic Current Source Technology
Stray Current Source,DC bias,Harmonic Current Source,Laboratory test
终稿
Kangguan Ke / Southern Power Grid Shenzhen Power Supply Bureau Co
Hong Shen / Southern Power Grid Shenzhen Power Supply Bureau Co
Xinde Zhu / Southern Power Grid Shenzhen Power Supply Bureau Co
Xing Wang / Southern Power Grid Shenzhen Power Supply Bureau Co
Fan Zhang / Southern Power Grid Shenzhen Power Supply Bureau Co
Zhuohong PAN / North China Electric Power University
Purpose/Aim

With the rapid development of rail transit, the risk of DC bias caused by stray current has attracted the attention of researchers. Therefore, it is necessary to carry out relevant tests in the laboratory. The core equipment is the stray current testing device, which needs to been developed.

Experimental/Modeling methods

Based on the harmonic current source technology, a stray current testing device has been proposed. After the three-phase power frequency alternating current is input, two groups of three-phase power supplies are generated through the phase-shifting transformer to supply power to the power units 1 and 2 respectively. The power units are connected in series after being rectified and inverted by an H bridge to realize 5-level output, and the 5-level output is output after passing through an LCL filter.

Results/discussion

When the equipment operates in the constant voltage control mode, the voltage command can be given by the analog quantity or internally generated (DC/multi-band sine wave, etc.), and the output voltage and capacitor current are controlled by double loops. When the equipment operates in the constant current mode, the current command can be given by the analog quantity or internally generated, and the output current is controlled by closed-loop.

Conclusions

In this paper, a stray current testing device based on harmonic current source technology has been proposed. It can reappear the stray current waveform measured on site and serve the transformer DC magnetic bias test.

 
重要日期
  • 会议日期

    09月25日

    2022

    09月29日

    2022

  • 08月15日 2022

    提前注册日期

  • 09月10日 2022

    报告提交截止日期

  • 11月10日 2022

    注册截止日期

  • 11月30日 2022

    初稿截稿日期

  • 11月30日 2022

    终稿截稿日期

主办单位
IEEE DEIS
承办单位
Chongqing University
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