737 / 2022-03-31 19:45:53
Comparative Analysis on Insulation Degradation Characteristics of Two Commercial Silicone Gels
Silicone gel,Insulation degradation,FTIR,Electrical trees,dielectric breakdown strength
终稿
Xinyu Jiang / State Key Laboratory of Electrical Insulation and Power Equipment;Xi'An Jiaotong University
Kaixuan Li / State Key Laboratory of Electrical Insulation and Power Equipment;Xi'An Jiaotong University
Ziyue Yang / Xi'an Jiaotong University
Boya Zhang / State Key Laboratory of Electrical Insulation and Power Equipment;Xi'An Jiaotong University
Xingwen Li / State Key Laboratory of Electrical Insulation and Power Equipment;Xi'An Jiaotong University
Silicone gels have been widely used as an encapsulation for power electronics modules, and their own insulation performance directly determines the voltage resistance reliability of electronic devices such as IGBT devices. Electrical treeing in two different silicone gels has been investigated using a typical pin-plane geometry. The purpose of this study was to investigate the difference in the electrical tree growth characteristics of two different commercial silicone gels under AC voltage. The bifurcation voltage is defined in this paper, and the electrical tree in each silicone gel grows at its respective bifurcation voltage. Combined with the data results of electrical tree growth rate, expansion coefficient, fractal dimension and accumulated damage, the insulation degradation characteristics of two silicone gels can be compared and analyzed.

 
重要日期
  • 会议日期

    09月25日

    2022

    09月29日

    2022

  • 08月15日 2022

    提前注册日期

  • 09月10日 2022

    报告提交截止日期

  • 11月10日 2022

    注册截止日期

  • 11月30日 2022

    初稿截稿日期

  • 11月30日 2022

    终稿截稿日期

主办单位
IEEE DEIS
承办单位
Chongqing University
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