Intelligent DC- and AC Power-Cycling Platform for Power Electronic Components
编号:87
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更新:2021-07-21 20:06:01 浏览:315次
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摘要
In this paper, a state-of-the-art, intelligent power cycling platform is introduced in detail. The test platform allows to perform both DC- and AC- power-cycling tests on power electronic discrete components as well as modules up to 70 Arms / 700 VDC. Vital parameters of the device under test (DUT) as junction temperature and on-state voltage are measured during the test. A 19” ‑ standard industrial rack is used, which enables a flexible and compact test platform design. A detailed description of the PCB structure and safety precautions is also provided.
关键词
accelerated power cycling test, reliability, lifetime estimation, on-line monitoring, wear-out, test apparatus
稿件作者
Kaichen Zhang
Aalborg Univeristy
Francesco Iannuzzo
Aalborg University
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