An Optimized Parameter Design Method for Desaturation Protection Circuit towards Fast Response Speed and Strong Noise Immunity
编号:70 访问权限:仅限参会人 更新:2021-07-21 20:04:10 浏览:205次 口头报告

报告开始:2021年08月27日 10:30(Asia/Shanghai)

报告时间:15min

所在会场:[Room2] Oral Session 2 [S5&S6] WBG Device Design and Gate Drivers

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摘要
This paper presents a theoretical analysis and an optimized parameter design method of desaturation short-circuit protection for fast response speed and strong noise immunity. First, the mechanism of false triggering of desaturation protection are analyzed in detail, and based on the analysis several key related factors are identified. Second, a noise suppression ability evaluation method and a corresponding optimized parameter design method based on aforementioned analysis are proposed, which is capable of enhancing noise immunity without sacrificing response speed. Third, two typical desaturation protection circuits are compared with the proposed evaluation method and optimized parameter design examples are presented. Finally, simulation and experimental results are presented to validiate the proposed parameter optimization method.
关键词
Desaturation,Short Circuit Protection,wide bandgap devices
报告人
Cheng Qian
Huazhong University of Science and Technology

稿件作者
Cheng Qian Huazhong University of Science and Technology
智强 王 华中科技大学
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重要日期
  • 会议日期

    08月25日

    2021

    08月27日

    2021

  • 04月21日 2021

    摘要截稿日期

  • 05月15日 2021

    摘要录用通知日期

  • 06月25日 2021

    终稿截稿日期

  • 08月24日 2021

    报告提交截止日期

  • 08月27日 2021

    注册截止日期

主办单位
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
承办单位
Huazhong University of Science and Technology
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