A Multi Time-Scale Electro-thermal Co-Simulation Approach of SiC-MOSFET Considering Distribution of Electro-thermal Stress on Chip
编号:117 访问权限:仅限参会人 更新:2021-07-21 20:06:20 浏览:310次 口头报告

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摘要
The purpose of this work is to propose a novel electro-thermal co-simulation approach for the new generation of SiC MOSFETs, by development of a Simulink-based compact and physical SiC MOSFET model including temperature dependency of physical parameters and a COMSOL-based three-dimensional finite element thermal model. The electrical model is capable to estimate the switching and the static behavior and the energy losses of the device accurately under a wide range of operational conditions, including high temperature operations, within a relatively fast simulation time. The three-dimensional finite element thermal model is established in COMSOL and a reasonable partition of the SiC MOSFET chip is conducted so that the different distribution of electro-thermal stress on chip can be observed. A MATLAB script is used to process the simulation data and feed the needed settings and parameters back into the two simulation platforms. The script is able to control the simulation steps of the two different models and the multi time-scale simulation is realized. Finally, the co-simulation approach is verified by experiments with a CREE 1200V/325A SiC MOSFET.
 
关键词
SiC MOSFET,modeling,electro-thermal coupling simulation,Co-Simulation
报告人
Xin Li
Naval University of Engineering

稿件作者
Xin Li Naval University of Engineering
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重要日期
  • 会议日期

    08月25日

    2021

    08月27日

    2021

  • 04月21日 2021

    摘要截稿日期

  • 05月15日 2021

    摘要录用通知日期

  • 06月25日 2021

    终稿截稿日期

  • 08月24日 2021

    报告提交截止日期

  • 08月27日 2021

    注册截止日期

主办单位
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
承办单位
Huazhong University of Science and Technology
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