364 / 2018-01-26 21:48:55
Temperature Dependence of 1.2 kV 4H-SiC Power MOSFET Body Diode over Temperature Range of 90K to 603K
silicon carbide (SiC); MOSFET body diode; reverse recovery characteristics; temperature dependence.
终稿
Jinwei Qi / Xi'an Jiaotong University
Kai Tian / Xi'an Jiaotong University
Zhangsong Mao / Xi'an Jiaotong University
Song Yang / Xi'an Jiaotong University
Wenjie Song / Xi'an Jiaotong University
Anping Zhang / Xi'an Jiaotong University
As the expansion of the application field, the temperature characteristics of power electronic devices is put forward more stringent requirements, such as in aeronautics and superconducting, etc. [1-3]. In this paper, the switching performance of 1.2kV MOSFET body diode is characterized at cryogenic and high temperatures. The temperature dependence on reverse recovery-related characteristics of body diode is measured and analyzed, including device forward voltage (Vf), reverse recovery charge (Qrr) and maximum reverse recovery current (Irm). The reverse recovery-related energy loss (Err) is quantified over a wide temperature range of 90K to 603K, especially at turn-off transient.
重要日期
  • 会议日期

    05月17日

    2018

    05月19日

    2018

  • 12月08日 2017

    摘要截稿日期

  • 01月30日 2018

    摘要录用通知日期

  • 02月10日 2018

    初稿截稿日期

  • 02月10日 2018

    终稿截稿日期

  • 05月19日 2018

    注册截止日期

主办单位
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
IEEE POWER ELECTRONIC SOCIETY
中国电源学会
中国半导体产业创新联盟
承办单位
西安交通大学
西安电子科技大学
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