196 / 2017-11-14 15:07:00

Automatic V-I Alignment for Switching Characterization of Wide Band Gap Power Devices

double pulse test,characterization

全体主题 > Device characterization and modeling

The propagation delay of probes leads to a significant error in the switching characterization of wide band gap power devices. Alignment of voltage and current (V-I) has become essential for the accurate measurement of switching losses. The conventional alignment methods are normally based on the calibration fixture or modification of test circuit, which are inaccurate or time-consuming. This work proposes an automatic, accurate, post-processing alignment strategy, which can be easily implemented in data processing software such as Matlab. Based on the theoretical switching characteristics, the V-I alignment is conducted and also verified by a double pulse test experiment.