活动简介

The IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC 2017) is the 25th in a series of international conferences sponsored by the International Federation for Information Processing Technical Committee (IFIP TC) 10 Working Group 5, the Institute of Electrical and Electronics Engineers (IEEE) Council on Electronic Design Automation (CEDA) and the IEEE Circuits and Systems Society (CASS), which explore the state-of-the-art in the areas of Very Large Scale Integration (VLSI) and System-on-Chip (SoC) design. VLSI-SoC 2017 is held under the broad theme: “The Internet of Things: SoC Opportunities and Challenges.”

Previous conferences have taken place in Edinburgh, Trondheim, Tokyo, Vancouver, Munich, Grenoble, Gramado, Lisbon, Montpellier, Darmstadt, Perth, Nice, Atlanta, Rhodes, Florianópolis, Madrid, Hong Kong, Santa Cruz, Istanbul, Playa del Carmen, Daejeon, and Tallinn.The purpose of VLSI-SoC is to provide a forum to exchange ideas and showcase academic as well as industrial research in architectures, circuits, devices, design automation, verification, test, and security, within digital, analog, and mixed-signal systems.

VLSI-SoC 2017 will be held from October 23, 2017, until October 25, 2017, on Yas Island in the city of Abu Dhabi, capital of the United Arab Emirates, home of the Etihad Airways Formula One Grand Prix, and a major political, economic, and cultural center on the Arabian Gulf.

征稿信息

重要日期

2017-04-26
摘要截稿日期
2017-05-03
初稿截稿日期
2017-06-26
初稿录用日期
2017-07-27
终稿截稿日期

征稿范围

Research topics of interest include, but are not limited to, the following:

  1. Analog, mixed-signal and sensor architectures
  2. Digital architectures: NoC, multi-core, and reconfigurable
  3. CAD: Synthesis and analysis
  4. Prototyping, verification, modeling, and simulation
  5. Circuits and systems for signal processing and communications
  6. Embedded systems: Architecture, design, and software
  7. Low-power and thermal-aware IC design
  8. Emerging semiconductor technologies
  9. Variability, reliability, and test
  10. Hardware security
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重要日期
  • 会议日期

    10月23日

    2017

    10月25日

    2017

  • 04月26日 2017

    摘要截稿日期

  • 05月03日 2017

    初稿截稿日期

  • 06月26日 2017

    初稿录用通知日期

  • 07月27日 2017

    终稿截稿日期

  • 10月25日 2017

    注册截止日期

主办单位
Masdar Institute of Science and Technology
协办单位
IEEE Circuits and Systems Society
IEEE Council on Electronic Design Automation
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