Welcome to the Fifteenth Annual IEEE Workshop on Microelectronics and Electron Devices (WMED 2017). WMED 2017 is a technical forum for reviewing and discussing all aspects of micro- and nano-electronics including processing, electrical characterization and reliability, design, and new device technologies. This workshop will consist of invited talks, contributed papers, and a poster session throughout the day. Faculty, students, and researchers in industry are encouraged to contribute presentations on either completed research or work-in-progress.
Microelectronic Device Processing and Process Integration
Trends in Submicron CMOS technology, Product development (DRAM, SRAM, Flash, CMOS Imagers), new device technologies (Phase Change Memory, Resistive Memory, Ferroelectric Memory), Novel transistors
Nanoelectronic Devices and MEMS
Novel processes, materials and device characterization on nanotubes, nanowires, quantum dots, molecular devices, MEMS research
Microelectronic Device Electrical and Reliability Testing
Dielectric reliability, Device reliability, Novel memory technology testing schemes
Semiconductor Packaging and Reliability
Semiconductor package reliability, Design for Manufacturability, Stacked die packaging and Novel assembly processes
Microelectronic Circuit Design
New product design, high-speed and/or low-power design techniques and architectures and memory sensing schemes
04月21日
2017
会议日期
初稿截稿日期
注册截止日期
2018年04月20日 美国
2018 IEEE Workshop on Microelectronics and Electron Devices2016年04月15日 美国 Boise, ID, USA
2016年IEEE微电子和电子器件研讨会2015年03月20日 美国
2015年IEEE微电子和电子器件研讨会2014年04月18日 美国
2014 IEEE微电子和电子设备研讨会2013年04月12日 美国
2013年IEEE微电子和电子设备研讨会
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