活动简介

The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, security, stringent runtime requirements for functional safety and cost constraints of a mass market the reliable operation of electronics in safety-critical domains is still a major challenge. The ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike.

征稿信息

征稿范围

  • Functional safety and security in the automotive domain    

  • Power-up, power-down and periodic test

  • Multi-layer dependability evaluation  

  • System level test

  • Verification and validation of automotive systems  

  • Built-In Self-Test (BIST and SBIST) in automotive systems

  • Automotive standards and certification  

  • Reuse of test infrastructure

  • Fault tolerance and self-checking circuits    

  • Functional and structural test generation

  • Dependability challenges of autonomous driving and e-mobility  

  • High quality volume test and minimizing DPPM

  • Aging effects on automotive electronics    

  • Life cycle test cost minimization

  • Analog and mixed signal test and fault simulation

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重要日期
  • 会议日期

    11月17日

    2016

    11月18日

    2016

  • 11月18日 2016

    注册截止日期

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