The IEEE International Board Test Workshop is the pre-eminent workshop for board and system level test, including technologies such as: 3D/2.5D test and SoC/NoC. BTW is best known for its interactive, discussion-based format. Presentations are not given formal time limits but generally continue until a robust discussion has ended. BTW was started in 2001 and continued through 2012. We took last year off to change venues, but are back in business this year.
BTW16 is sponsored by the IEEE Philadelphia Section and the High Plains Section, in cooperation with the IEEE Computer Society, IEEE Computer Society Test Technology Technical Council (TTTC) and is supported by the Board Test Technical and Activities Committee (BTTAC).
Emerging Standards: IEEE 1149.1-2013; IEEE 1149.6; IEEE 1149.10; IEEE1687; IEEE P1838; IEEE 1581; IEEE 1687.1
Hot Topics: 2.5D/3D/SoC/NoC test; System/Application level test and debug; Test Security; Counterfeit Detection; The role of data in Board/System Test; High Speed Optics/Photonics; Component to System Correlation
Traditional Test Techniques: Inspection; Future of ICT; Built-in/Built-out Test; HW/SW Co-verification/Test/Diagnosis; Test Economics
09月13日
2016
09月15日
2016
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