As we move to increase the power density of the package and system by ~10x or more, significant issues occur on and around the semiconductor chip, in/on the package, with the gate driver, in the bussing, and overall system isolation as higher voltages are pushed into smaller spaces. Topics to be covered include: Wide bandgap devices and modules Packaging (device through system) Gate drivers Capacitors and Passives Thermal Management Modeling and CAD (General) Modeling and CAD for Reliability High Temperature Modules/Packaging Dielectrics (several sessions ranging the topics above).
Papers are solicited in the following topics:
System integration and optimization
Compact converter design techniques
Modeling and simulation
Materials and packaging technology
Power semiconductor devices
Power modules
Gate/base drivers
Thermal management and 3D packaging
Electromagnetic interference
Sensors and protection
High-frequency magnetics
High-temperature capacitors
Reliability assessment and lifetime prediction
Functional safety and product/data sheet standards
04月05日
2017
04月07日
2017
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