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SPIE Advanced Lithography, the premier conference for the lithography community. For 40 years, SPIE has brought together industry leaders to solve the latest challenges in lithography and patterning in the semiconductor industry.

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征稿范围

1: Overviews of Nanopatterning Challenges

2: New Plasma Sources and New Etching Technologies

3: Nanopatterning for Advanced Logic and Memory Technology Nodes

4: Patterning Integration Schemes (multilayer, patterning, self-aligned patterning, etc.)

5: Patterning Materials and Etch: Joint Session with Conferences 9779 and 9782

6: Emerging Patterning Technologies (DSA, and other) Interactive Poster Session

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重要日期
  • 会议日期

    02月22日

    2016

    02月23日

    2016

  • 02月23日 2016

    注册截止日期

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