活动简介

The 16th Electronics Packaging Technology Conference (EPTC 2014) is an International event organized by the IEEE Reliability/ CPMT/ED Singapore Chapter and sponsored by IEEE CPMT Society. EPTC 2014 is a three-day event, featuring 2 keynote speeches, 5 invited papers and a panel session by pioneers from key regions in the world, 6 short courses by international experts, ~150 technical and poster presentations by researchers, an industrial technology exhibition, and last but not least our exciting and fun social networking activities. Since its inauguration in 1997, EPTC has evolved over the years into a highly reputed electronics packaging conference in Asia. The conference provides a good coverage of technological developments in all areas of electronics packaging from design to manufacturing and operation. It is a distinguished forum that brings together researchers, engineers and experts from all over the world to engage actively in technical interactions.

征稿信息

征稿范围

You are invited to submit an abstract, presenting new development in the following categories: Advanced Packaging: Flip-chip and wire-bond packaging, embedded passives and actives on substrates, 3D System in Packaging, etc. TSV/Wafer Level Packaging: Wafer level packaging, embedded chip packaging, 2.5D/3D integration, TSV, Silicon interposer, RDL, bumping technologies, etc. Interconnection Technologies: Wire-bondtechnology, Flip-chip technology, solderalternatives (ICP, ACP, ACF, NCP), die attachment (Pb-free), etc. Emerging Technologies: Packaging technologies for MEMS, biomedical, optoelectronics, photo voltaic, printed electronics, wearable electronics, Photonics, LED, etc. Materials & Processes: Materials and processes for traditional and advanced microelectronic systems, MEMS, solar, green and biomedical packaging. Electrical Modeling & Simulations: Power plane modeling, signal integrity analysis of substrate/package. Mechanical Modeling & Simulations: Thermo-mechanical, moisture, fracture, fatigue, vibration, and drop impact modeling, Chip-package interaction, etc. Thermal Characterization & Cooling Solutions: Thermal modeling and simulation, component and system level thermal management and characterization Quality & Reliability: Component, board and system level reliability assessment, Interfacial adhesion, accelerated testing, failure characterization, etc. Wafer/Package Testing & Characterization: High-speed test architectures and systems design, test methodologies, probe card design, package-test interaction, high-throughput testing etc.
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重要日期
  • 会议日期

    12月03日

    2014

    12月05日

    2014

  • 12月05日 2014

    注册截止日期

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Packaging and Manufacturing Technology Society
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