Issues related to On-line testing techniques, and more generally to design for robustness, are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective design for robustness techniques. These needs have increased dramatically with the introduction of nanometer technologies, which impact adversely noise margins; process, voltage and temperature variations; aging and wear-out; soft error and EMI sensitivity; power density and heating; and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs. Design for reliability becomes also mandatory for reducing power dissipation, as voltage reduction, often used to reduce power, strongly affects reliability by reducing noise margins and thus the sensitivity to soft-errors and EMI, and by increasing circuit delays and thus the severity of timing faults. There is also a strong relation between Design for Reliability and Design for Security, as security attacks are often fault-based.
The International Symposium on On-Line Testing and Robust System Design (IOLTS), is an established forum for presenting novel ideas and experimental data on these areas. The Symposium is sponsored by the IEEE Council on Electronic Design Automation (CEDA) and the 2018 edition is organized by the IEEE Computer Society Test Technology Technical Council, the University of Athens, and the TIMA Laboratory.
The topics of interest include (but are not limited to) the following ones:
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2024年07月03日 法国 Rennes
2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design2023年07月03日 希腊 Crete
2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design2022年09月12日 意大利 Torino
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design2021年06月28日 意大利 Torino
2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design2017年07月03日 希腊 Thessaloniki
2017 IEEE第二十三届在线测试与强大系统设计国际研讨会2016年07月04日 西班牙 Catalunya,Spain
2016年第22届IEEE国际在线测试和稳健系统设计研讨会
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