IWCT2017 is to be held in conjunction with ICST2017 focusing on combinatorial testing. The workshop welcomes academic research submissions, as well as industrial experience reports.
Combinatorial Testing (CT) is a widely applicable generic methodology and technology for software verification and validation, considered a testing best practice. In a combinatorial test plan, all interactions between parameters up to a certain level are covered. For example, in pairwise testing, for every pair of parameters, every pair of values will appear at least once. Studies show that CT is more efficient and effective than random testing.
CT has gained significant interest in recent years, both in research and in practice. However, many issues still remain unresolved, and much research is still needed in the field. For example, while pairwise testing is a well recognized and popular test planning method, investigations of actual failures in a number of software and systems convincingly show that pairwise testing is usually not sufficient so high strength CT (i.e., t-way for t>2) may be needed.
In addition, the combinatorial test suites need to exclude invalid combinations of test values that cannot be executed, which limits the degrees of freedom the algorithms have, thus complicating the problem. Moreover, modeling languages and tools for easily capturing the input test space are also required for real-life applicability of CT. Other obstacles for wide acceptance of CT in industry are the gap between the generated test plans and executable tests, and the difficulty in determining expected results for the generated tests. Finally, empirical studies on CT, as well as thorough comparison with other methods are also required.
In this workshop, we plan to bring together researchers actively working on combinatorial testing, and create a productive and creative environment for sharing and collaboration. Since there is no other venue dedicated to CT, yet there are many researchers working in the field, we expect, like in previous years, to see high responsiveness to take part in the workshop. Researchers attending the workshop will have an opportunity to publish their work in a dedicated venue, create new collaborations and take active part in the growing community of researchers working in the field.
The workshop will also be a meeting place between academia and industry, thus uniting academic excellence and industrial experience and needs. This will allow participants from academia to learn about the industrial experience in practical application of CT to real-life testing problems, and together with the colleagues from industry identify the difficulties that are obstacle to wider application of CT, and should be addressed in future research. Industrial participants will have an opportunity to meet the leading scientists in the field, and hear about the latest advances and innovations.
Combinatorial testing workflow
Modeling the input space for CT
Efficient algorithms to generate t-way test suites, especially involving support of constraints
Determination of expected system behavior for each test case
Executing CT test suites
Combinatorial testing based fault localization
Implementation of CT with existing testing infrastructures
Handling changes in test requirements
Real-world experience in deployment of combinatorial testing
Empirical studies and feedback from practical applications of CT
Evaluation and return of investment metrics to assess the degree of usefulness of CT
Methodology used for test space modeling and determination of interaction coverage requirements
Discussion of challenges and open problems in the application of CT in industrial settings
Applicability of combinatorial testing
Comparison and combination of CT with other dynamic verification methods
Investigation of historical records of failures to determine the kind of CT which may have detected faults
Combinatorial testing for concurrent and real-time systems
CT for testing cloud computing systems and use of combinatorial methods in cloud architecture
Application of CT in other domains, e.g. information security, study of gene regulation and other biotechnology applications, mechanical engineering, etc.
Combinatorial testing of feature models for software product lines
Combinatorial and complementing methods
Combinatorial analysis of existing test suites
Test plan reduction and completeness
CT and coverage metrics – combining the two, and studying the relationship between them
03月13日
2017
会议日期
初稿截稿日期
终稿截稿日期
注册截止日期
2018年04月13日 瑞典
第七届组合测试国际研讨会2017年07月25日 捷克共和国 Prague
2017 IEEE国际组合测试及其应用研讨会2016年04月10日 美国 Chicago
第五届国际软件组合测试研讨会2015年04月13日 奥地利
第4届国际组合测试研讨会
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