We are soliciting papers describing significant new findings in the following or related areas: 
Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

• Single-Event Charge Collection Phenomena and Mechanisms
• Radiation Transport, Energy Deposition and Dosimetry
• Ionizing Radiation Effects
• Materials and Device Effects
• Displacement Damage
• Processing-Induced Radiation Effects

Radiation Effects on Electronic and Photonic Devices, Circuits and Systems

• Single-Event Effects

• MOS, Bipolar and Advanced Technologies

• Isolation Technologies, such as SOI and SOS

• Optoelectronic and Optical Devices and Systems

• Methods for Hardened Design and Manufacturing

• Modeling of Devices, Circuits and Systems

• Cryogenic or High Temperature Effects

• Novel Device Structures, such as MEMs and Nanotechnologies

• Techniques for Hardening Circuits and Systems

Space, Atmospheric, and Terrestrial Radiation Effects 

• Characterization and Modeling of Radiation Environments

• Space Weather Events and Effects

• Spacecraft Charging

• Predicting and Verifying Soft Error Rates (SER)

Hardness Assurance Technology and Testing

• New Testing Techniques, Guidelines and Hardness Assurance Methodology

• Unique Radiation Exposure Facilities or Novel Instrumentation Methods

• Dosimetry