活动简介

The IEEE International Board Test Workshop is the pre-eminent workshop for board and system level test, including technologies such as: 3D/2.5D test and SoC/NoC. BTW is best known for its interactive, discussion-based format. Presentations are not given formal time limits but generally continue until a robust discussion has ended. BTW was started in 2001 and continued through 2012. We took last year off to change venues, but are back in business this year.

BTW16 is sponsored by the IEEE Philadelphia Section and the High Plains Section, in cooperation with the IEEE Computer Society, IEEE Computer Society Test Technology Technical Council (TTTC) and is supported by the Board Test Technical and Activities Committee (BTTAC).

征稿信息

重要日期

2016-07-15
初稿截稿日期
2016-09-01
初稿录用日期
2016-09-06
终稿截稿日期

征稿范围

  • Emerging Standards: IEEE 1149.1-2013; IEEE 1149.6; IEEE 1149.10; IEEE1687; IEEE P1838; IEEE 1581; IEEE 1687.1

  • Hot Topics: 2.5D/3D/SoC/NoC test; System/Application level test and debug; Test Security; Counterfeit Detection; The role of data in Board/System Test; High Speed Optics/Photonics; Component to System Correlation

  • Traditional Test Techniques: Inspection; Future of ICT; Built-in/Built-out Test; HW/SW Co-verification/Test/Diagnosis; Test Economics

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重要日期
  • 会议日期

    09月13日

    2016

    09月15日

    2016

  • 07月15日 2016

    初稿截稿日期

  • 09月01日 2016

    初稿录用通知日期

  • 09月06日 2016

    终稿截稿日期

  • 09月15日 2016

    注册截止日期

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