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活动简介

Change is the only constant in the Failure Analysis world. There is always the Next Generation technology to be understood, the Next Generation material to be learned, the Next Generation equipment to be mastered. In this changing world, the Next Generation constantly challenges the knowledge of today's engineers. The International Symposium for Testing and Failure Analysis (ISTFA) answers this challenge. At ISTFA, you can learn from the experts, network with people who can support your work, explore the latest apps and tools for the failure analysis lab, and become a knowable presenter yourself, teaching others. ISTFA offers opportunities for all levels of proficiency, from the Next Generation of engineers, who seek to boost their starting career, to expert engineers, who seek insight into Next Generation challenges already today.

Now accepting papers for the technical program of the 42nd International Symposium for Testing and Failure Analysis (ISTFA). Paper selection is based entirely on information submitted in abstracts and will be evaluated on novelty, completeness, quality, and benefit to the FA community. Submit your minimum two-page abstract including images, figures, and references.

Deadline for Abstract Submission: Extended to April 25, 2016.

征稿信息

征稿范围

  • 3D Devices Failure Analysis

  • Detecting and Preventing Counterfeit Microelectronics

  • Case Studies and FA Process

  • Device FA 

  • Emerging FA Techniques and Concepts

  • FIB Circuit Analysis and Edit

  • FIB Sample Preparation

  • Packaging and Assembly Level FA

  • Board and System Level FA

  • Reverse Engineering

  • Fault Isolation

  • Microscopy

  • Sample Preparation and Device Deprocessing

  • Scanning Probe Analysis

  • Nanoprobing and Electrical Characterization

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重要日期
  • 会议日期

    11月06日

    2016

    11月10日

    2016

  • 11月10日 2016

    注册截止日期

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